2025 306-300 Quiz, Test 306-300 Dumps.zip | LPIC-3 Exam 306: High Availability and Storage Clusters Best Practice - Cads-Group

  • Exam Number/Code : 306-300
  • Exam Name : LPIC-3 Exam 306: High Availability and Storage Clusters
  • Questions and Answers : 260 Q&As
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NEW QUESTION: 1
The implementations group has been using the test bed to do a 'proof-of-concept' that requires both Client 1 and Client 2 to access the WEB Server at 209.65.200.241.
After several changes to the network addressing, routing scheme, DHCP services,
NTP services, layer 2 connectivity, FHRP services, and device security, a trouble ticket has been opened indicating that Client 1 cannot ping the 209.65.200.241 address.
Use the supported commands to isolated the cause of this fault and answer the following questions.
On which device is the fault condition located?
A. R3
B. R2
C. DSW2
D. R4
E. ASW1
F. R1
G. DSW1
Answer: F
Explanation:
On R1, we need to permit IP 209.65.200.222/30 under the access list.

NEW QUESTION: 2

A. Option D
B. Option A
C. Option C
D. Option B
Answer: B

NEW QUESTION: 3
What are the first steps the NBX administrator would take to configure a second generation NBX Digital Line Card (DLC)?
A. Choose Device Configuration / Digital Line Cards; select the card to be configured from this menu then click Modify
B. Choose Device Configuration / Line Card Ports; select card type from Device Type list; select the new card from the DLC list; click Modify
C. Choose System Configuration / Device Configuration / TAPI settings; select card type from Device Type list; select the new card from the DLC list; click Modify
D. Choose System Configuration / Device Configuration / Digital Line Cards; select card type from Device Type list; select the new card from the DLC list; click Modify
Answer: A

 

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2025 306-300 Quiz, Test 306-300 Dumps.zip | LPIC-3 Exam 306: High Availability and Storage Clusters Best Practice - Cads-Group


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